Configured to YOUR requirements
Advanced software for precise stochastic measurement, inspection and defect detection – tailored to your needs
If the predefined flow of YieldPro™ doesn’t specifically match our customer’s needs, we offer YieldPro+™, a flexible, completely unrestricted configuration capable of handling a variety of cases where speed or specific process gating measurement is crucial.
Measure images from any manufacturer
A flexible and entirely reconfigurable utility.
No predefined flow.
YieldPro+™ is an advanced CD measurement application with innovative approaches in preprocessing, measurement, and Neural Network modeling to ensure superior precision and sensitivity. Large grab stochastic measurements, texture, background, defect estimation, and statistics are all available.
FEATURES
- Multilayer, multipattern, and multi-measurement capabilities
- A significant number of native embedded libraries with a high level of integration, ensuring remarkable processing speed
- Capable of connecting LabVIEW and/or Python external libraries
- Embedded PR/Morphology/Texture/Golden comparison, geometry and other modules
- Extremely fast execution modules naturally handling any image formats
YieldPro+™
Stochastics
A larger field of view allows etrology® to measure up to 800 contacts in a single grab – increasing the likelihood of capturing random failures.
