VeraSem 3D
NANOSem 3D
Verity I
Verity II
Verity III
Verity IV I +
DR-SEM
SEMVision DR-300
SEMVision G2
SEMVision G2+
SEMVision G3
SEMVision G4
SEMVision G5
Inspection
WF-736DUO
Compass 200
Compuls 2T
Compuls 3T
Complus 4T
VeraSem 3D
NANOSem 3D
Verity I
Verity II
Verity III
Verity IV I +
DR-SEM
SEMVision DR-300
SEMVision G2
SEMVision G2+
SEMVision G3
SEMVision G4
SEMVision G5
Inspection
WF-736DUO
Compass 200
Compuls 2T
Compuls 3T
Complus 4T
what we do
Comprehensive inventory of over 60,000 spare parts in stock.
- End of life issues resolution
- Upgrades
- Optimization
We specialize
in the
remanufacturing and renewal of equipment manufactured by Applied Materials®, KLA-Tencor, and August Technologies (ONTO™).
Hardware and Application training courses on-site or at GTI's applications lab.
Elite Field Service Experts stationed in North America, Europe, and Asia. Programs include on-call and on-site solutions, tool installation, and tool relocation services.
State-of-the-art, fully calibrated metrology equipment currently running customer products for evaluation or development.
- Special wafer thicknesses
- Exotic materials
- 150mm, 200mm, 300mm wafers
Applied Materials®, Inc. has introduced the SEMVision DR-SEM system, a fully-automated defect review and classification scanning electron microscope specifically designed for in-line operation on advanced semiconductor production lines. The system uses several SEM imaging and material analysis techniques to improve chipmakers’ yield earning cycles during fab ramp-up and enable tighter yield control in volume production.
GTI Has in stock the following tools in stock: AMAT applied materials PDC SEMvision Semvision VeritySEM Verity sem ComPASS Compass ComPLUS Complus WF-736 Semvision G2 G2+ G3 G4 G5 SEMvision G2 G2+ G3 G4 G5 VeritySEM VeraSEM NanoSEM AMAT Verity I II III AMAT Verity 2 Verity2 verity2 verity 2 amat verity 2 AMAT Verity 3 AMAT Verity 1 AMAT Complus MP 2/2T 3/3T 4/4T AMAT Compass 200 AMAT Compass 300 AMAT Semvision G2 AMAT Semvision G2+ AMAT Semvision G3 SemvisionG3 AMAT Semvision G4 SemvisionG4 AMAT Semvision G5 SemvisionG5 AMAT SemVision G2 AMAT SemVision G2+ AMAT SemVision G3 SemvisionG3 AMAT SemVision G4 SemvisionG4 AMAT SemVision G5 SemvisionG5
Beginning first half of 2020, GTI developed the capability of processing transparent wafers on DR-SEM and CD-SEM tools.
Silicon Carbide H4 and H6, GaAs, Sapphire wafers, ZnO, Gallium Nitride wafers, Lithium Niobate wafers, SOI, and Quartz.
Watch: one of our tools running Final ADC test at GTI’s lab
GTI Has in stock the following tools in stock: AMAT applied materials PDC SEMvision Semvision VeritySEM Verity sem ComPASS Compass ComPLUS Complus WF-736 Semvision G2 G2+ G3 G4 G5 SEMvision G2 G2+ G3 G4 G5 VeritySEM VeraSEM NanoSEM AMAT Verity I II III AMAT Verity 2 Verity2 verity2 verity 2 amat verity 2 AMAT Verity 3 AMAT Verity 1 AMAT Complus MP 2/2T 3/3T 4/4T AMAT Compass 200 AMAT Compass 300 AMAT Semvision G2 AMAT Semvision G2+ AMAT Semvision G3 SemvisionG3 AMAT Semvision G4 SemvisionG4 AMAT Semvision G5 SemvisionG5 AMAT SemVision G2 AMAT SemVision G2+ AMAT SemVision G3 SemvisionG3 AMAT SemVision G4 SemvisionG4 AMAT SemVision G5 SemvisionG5
Critical dimension (CD) metrology is one of the most essential technologies in semiconductor manufacturing. Much media attention is devoted to the ever shrinking feature sizes of microelectronic devices, as this parameter heavily influences speed of operation and power demands. Less appreciated is the fact that while the dimensions are on the nanometer scale, the manufacturing tolerances must be far smaller. This places great demands on the quality assurance assessment techniques.
GTI Has in stock the following tools in stock: AMAT applied materials PDC SEMvision Semvision VeritySEM Verity sem ComPASS Compass ComPLUS Complus WF-736 Semvision G2 G2+ G3 G4 G5 SEMvision G2 G2+ G3 G4 G5 VeritySEM VeraSEM NanoSEM AMAT Verity I II III AMAT Verity 2 Verity2 verity2 verity 2 amat verity 2 AMAT Verity 3 AMAT Verity 1 AMAT Complus MP 2/2T 3/3T 4/4T AMAT Compass 200 AMAT Compass 300 AMAT Semvision G2 AMAT Semvision G2+ AMAT Semvision G3 SemvisionG3 AMAT Semvision G4 SemvisionG4 AMAT Semvision G5 SemvisionG5 AMAT SemVision G2 AMAT SemVision G2+ AMAT SemVision G3 SemvisionG3 AMAT SemVision G4 SemvisionG4 AMAT SemVision G5 SemvisionG5
Since 2012, GTi has been providing Inspection and Metrology solutions for Applied Materials® platforms, delivering fully remanufactured systems, boasting an extensive inventory of ready-to-ship spare parts, and delivering expert service and applications support worldwide
SEMVision Defect Review
VeritySEM Critical Dimension
WF | Compass | Complus Darkfield Inspection
Over 60,000 parts in stock
Consumables and non-consumables
Legacy+Obsolesence upgrades
RS170 camera upgrade for all CD SEMS
Hardware and Application support
Level 5 FSE's
Flexible service support contracts
Size conversions + Chamber additions
Basic tool operation, equipment tasks, and troubleshooting
Advanced Applications for improved theoretical and operational knowledge
150-300mm wafers
Special Wafer thicknesses
Exotic materials
Calibration wafers
State-of-the-art
Special Wafer thicknesses
Exotic materials
Calibration wafers
State-of-the-art, fully calibrated metrology equipment
Currently running customer products for evaluation and development
SEMVision Defect Review
VeritySEM CDSEM
WF | Compass | Complus Darkfield Inspection
Basic tool operation, equipment tasks, and troubleshooting
Advanced Applications for improved theoretical and operational knowledge
Hardware and
Application support
Level 5 FSE’s
Flexible service support contracts
Over 60,000 parts in stock
Legacy + Obsolescence upgrades
Legacy + Obsolescence upgrades
RS170 upgrades for all CD-SEMs
Size conversions +
chamber additions
Applied Materials®, Inc. has introduced the SEMVision DR-SEM system, a fully-automated defect review and classification scanning electron microscope specifically designed for in-line operation on advanced semiconductor production lines. The system uses several SEM imaging and material analysis techniques to improve chipmakers’ yield learning cycles during fab ramp-up and enables tighter yield control in volume production.
The Applied Materials®, Inc. VeraSEM family of system’s exceptional in-line accuracy and process control eliminate more time-consuming and costly off-line wafer cross-sectioning while helping chipmakers to streamline process development, improve device performance and yield, and shorten ramp times to high-volume production.
Applied Materials®, Inc. has introduced the SEMVision DR-SEM system, a fully-automated defect review and classification scanning electron microscope specifically designed for in-line operation on advanced semiconductor production lines. The system uses several SEM imaging and material analysis techniques to improve chipmakers’ yield learning cycles during fab ramp-up and enables tighter yield control in volume production.
The Applied Materials®, Inc. VeraSEM family of system’s exceptional in-line accuracy and process control eliminate more time-consuming and costly off-line wafer cross-sectioning while helping chipmakers to streamline process development, improve device performance and yield, and shorten ramp times to high-volume production.
Headquarters
15936 N 78th St
Scottsdale, AZ 85260
Toll Free: (800) 608-4834
Local: (480) 400-6910
Sales
Asia
GTI Technology Limited
Unit E. 11/F Tower B Billion Center No. 1 Wang Kwong Road Kowloon Bay
Hong Kong
+86-13817852188
+14802955535
Europe North
TELTEC
www.teltec.com
Am Moosbach 6
74535 Mainhardt
Phone: +49 790 391 4412
Mobile: +49 173 279 1153
Fax: +49 790 391 4411
Europe South
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Teltec SAS
939, rue de la croix verte
34090 Montpellier
Phone: +33 467 22 40 00
Fax: +33 467 22 26 37
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