Comprehensive inventory of over 60,000 spare parts in stock. - End of life issues resolution - Upgrades - Optimization
Complete System Sales, Turn-key Solutions
We specialize in the remanufacturing and renewal of equipment manufactured by Applied Materials®, KLA-Tencor, and August Technologies (ONTO™).
Training Packages
Hardware and Application training courses on-site or at GTI's applications lab.
Expert Service, Support, Hardware, and Application
Elite Field Service Experts stationed in North America, Europe, and Asia. Programs include on-call and on-site solutions, tool installation, and tool relocation services.
Demo Lab and Foundry Service
State-of-the-art, fully calibrated metrology equipment currently running customer products for evaluation or development. - Special wafer thicknesses - Exotic materials - 150mm, 200mm, 300mm wafers
System Sales | Service Support | Calibration | Demo Lab | Upgrades | Spares
Defect Review SEM
Applied Materials®, Inc. has introduced the SEMVision DR-SEM system, a fully-automated defect review and classification scanning electron microscope specifically designed for in-line operation on advanced semiconductor production lines. The system uses several SEM imaging and material analysis techniques to improve chipmakers’ yield earning cycles during fab ramp-up and enable tighter yield control in volume production.
GTI Has in stock the following tools in stock: AMAT applied materials PDC SEMvision Semvision VeritySEM Verity sem ComPASS Compass ComPLUS Complus WF-736 Semvision G2 G2+ G3 G4 G5 SEMvision G2 G2+ G3 G4 G5 VeritySEM VeraSEM NanoSEM AMAT Verity I II III AMAT Verity 2 Verity2 verity2 verity 2 amat verity 2 AMAT Verity 3 AMAT Verity 1 AMAT Complus MP 2/2T 3/3T 4/4T AMAT Compass 200 AMAT Compass 300 AMAT Semvision G2 AMAT Semvision G2+ AMAT Semvision G3 SemvisionG3 AMAT Semvision G4 SemvisionG4 AMAT Semvision G5 SemvisionG5 AMAT SemVision G2 AMAT SemVision G2+ AMAT SemVision G3 SemvisionG3 AMAT SemVision G4 SemvisionG4 AMAT SemVision G5 SemvisionG5
News
Beginning first half of 2020, GTI developed the capability of processing transparent wafers on DR-SEM and CD-SEM tools.
Silicon Carbide H4 and H6, GaAs, Sapphire wafers, ZnO, Gallium Nitride wafers, Lithium Niobate wafers, SOI, and Quartz.
Watch: one of our tools running Final ADC test at GTI’s lab
GTI Has in stock the following tools in stock: AMAT applied materials PDC SEMvision Semvision VeritySEM Verity sem ComPASS Compass ComPLUS Complus WF-736 Semvision G2 G2+ G3 G4 G5 SEMvision G2 G2+ G3 G4 G5 VeritySEM VeraSEM NanoSEM AMAT Verity I II III AMAT Verity 2 Verity2 verity2 verity 2 amat verity 2 AMAT Verity 3 AMAT Verity 1 AMAT Complus MP 2/2T 3/3T 4/4T AMAT Compass 200 AMAT Compass 300 AMAT Semvision G2 AMAT Semvision G2+ AMAT Semvision G3 SemvisionG3 AMAT Semvision G4 SemvisionG4 AMAT Semvision G5 SemvisionG5 AMAT SemVision G2 AMAT SemVision G2+ AMAT SemVision G3 SemvisionG3 AMAT SemVision G4 SemvisionG4 AMAT SemVision G5 SemvisionG5
System Sales | Service Support | Calibration | Demo Lab | Upgrades | Spares
Critical Dimension Metrology Systems
Critical dimension (CD) metrology is one of the most essential technologies in semiconductor manufacturing. Much media attention is devoted to the ever shrinking feature sizes of microelectronic devices, as this parameter heavily influences speed of operation and power demands. Less appreciated is the fact that while the dimensions are on the nanometer scale, the manufacturing tolerances must be far smaller. This places great demands on the quality assurance assessment techniques.
GTI Has in stock the following tools in stock: AMAT applied materials PDC SEMvision Semvision VeritySEM Verity sem ComPASS Compass ComPLUS Complus WF-736 Semvision G2 G2+ G3 G4 G5 SEMvision G2 G2+ G3 G4 G5 VeritySEM VeraSEM NanoSEM AMAT Verity I II III AMAT Verity 2 Verity2 verity2 verity 2 amat verity 2 AMAT Verity 3 AMAT Verity 1 AMAT Complus MP 2/2T 3/3T 4/4T AMAT Compass 200 AMAT Compass 300 AMAT Semvision G2 AMAT Semvision G2+ AMAT Semvision G3 SemvisionG3 AMAT Semvision G4 SemvisionG4 AMAT Semvision G5 SemvisionG5 AMAT SemVision G2 AMAT SemVision G2+ AMAT SemVision G3 SemvisionG3 AMAT SemVision G4 SemvisionG4 AMAT SemVision G5 SemvisionG5
METROLOGY EXPERTS FOCUSED ON ONE THING - YOU
Since 2012, GTi has been providing Inspection and Metrology solutions for Applied Materials® platforms, delivering fully remanufactured systems, boasting an extensive inventory of ready-to-ship spare parts, and delivering expert service and applications support worldwide
Applied Materials®, Inc. has introduced the SEMVision DR-SEM system, a fully-automated defect review and classification scanning electron microscope specifically designed for in-line operation on advanced semiconductor production lines. The system uses several SEM imaging and material analysis techniques to improve chipmakers’ yield learning cycles during fab ramp-up and enables tighter yield control in volume production.
Critical Dimension
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The Applied Materials®, Inc. VeraSEM family of system’s exceptional in-line accuracy and process control eliminate more time-consuming and costly off-line wafer cross-sectioning while helping chipmakers to streamline process development, improve device performance and yield, and shorten ramp times to high-volume production.