VeraSem 3D

NANOSem 3D

Verity I

Verity II

Verity III

Verity IV I +

DR-SEM

SEMVision DR-300

SEMVision G2

SEMVision G2+

SEMVision G3

SEMVision G4

SEMVision G5

Inspection

WF-736DUO

Compass 200

Compuls 2T

Compuls 3T

Complus 4T

Join a team of thinkers, fixers, and doers who believe the future is never finished.

State-of-the-Art Metrology Tool Experts

what we do

Spare Parts and Support Equipment

Comprehensive inventory of over 60,000 spare parts in stock.
- End of life issues resolution
- Upgrades
- Optimization

Complete System Sales, Turn-key Solutions

We specialize
in the
remanufacturing and renewal of equipment manufactured by Applied Materials®, KLA-Tencor, and August Technologies (ONTO™).

Training Packages

Hardware and Application training courses on-site or at GTI's applications lab.

Expert Service, Support, Hardware, and Application

Elite Field Service Experts stationed in North America, Europe, and Asia. Programs include on-call and on-site solutions, tool installation, and tool relocation services.

Demo Lab and Foundry Service

State-of-the-art, fully calibrated metrology equipment currently running customer products for evaluation or development.
- Special wafer thicknesses
- Exotic materials
- 150mm, 200mm, 300mm wafers

System Sales | Service Support | Calibration | Demo Lab | Upgrades | Spares

Defect Review SEM

Applied Materials®, Inc. has introduced the SEMVision DR-SEM system, a fully-automated defect review and classification scanning electron microscope specifically designed for in-line operation on advanced semiconductor production lines. The system uses several SEM imaging and material analysis techniques to improve chipmakers’ yield earning cycles during fab ramp-up and enable tighter yield control in volume production.

GTI Has in stock the following tools in stock: AMAT applied materials PDC SEMvision Semvision VeritySEM Verity sem ComPASS Compass ComPLUS Complus WF-736 Semvision G2 G2+ G3 G4 G5 SEMvision G2 G2+ G3 G4 G5 VeritySEM VeraSEM NanoSEM AMAT Verity I II III AMAT Verity 2 Verity2 verity2 verity 2 amat verity 2 AMAT Verity 3 AMAT Verity 1 AMAT Complus MP 2/2T 3/3T 4/4T AMAT Compass 200 AMAT Compass 300 AMAT Semvision G2 AMAT Semvision G2+ AMAT Semvision G3 SemvisionG3 AMAT Semvision G4 SemvisionG4 AMAT Semvision G5 SemvisionG5 AMAT SemVision G2 AMAT SemVision G2+ AMAT SemVision G3 SemvisionG3 AMAT SemVision G4 SemvisionG4 AMAT SemVision G5 SemvisionG5

News

Beginning first half of 2020, GTI developed the capability of processing transparent wafers on DR-SEM and CD-SEM tools.

Silicon Carbide H4 and H6, GaAs, Sapphire wafers, ZnO, Gallium Nitride wafers, Lithium Niobate wafers, SOI, and Quartz.

Watch: one of our tools running Final ADC test at GTI’s lab

System Sales | Service Support | Calibration | Demo Lab | Upgrades | Spares

Critical Dimension Metrology Systems

Critical dimension (CD) metrology is one of the most essential technologies in semiconductor manufacturing. Much media attention is devoted to the ever shrinking feature sizes of microelectronic devices, as this parameter heavily influences speed of operation and power demands. Less appreciated is the fact that while the dimensions are on the nanometer scale, the manufacturing tolerances must be far smaller. This places great demands on the quality assurance assessment techniques.

METROLOGY EXPERTS FOCUSED ON ONE THING - YOU

Since 2012, GTi has been providing Inspection and Metrology solutions for Applied Materials® platforms, delivering fully remanufactured systems, boasting an extensive inventory of ready-to-ship spare parts, and delivering expert service and applications support worldwide

GTi NEWS

always closer to you

GTI NEWS

always closer to you

Our Solutions

ADVANCED DEMO LAB

State-of-the-art, fully calibrated metrology equipment

Currently running customer products for evaluation and development

COMPLETE SYSTEM SALES

SEMVision Defect Review

VeritySEM CDSEM

WF | Compass | Complus Darkfield Inspection

TRAINING OFFERINGS

Basic tool operation, equipment tasks, and troubleshooting

Advanced Applications for improved theoretical and operational knowledge

SERVICE EXPERTS

Hardware and
Application support

Level 5 FSE’s

Flexible service support contracts

SPARE
PARTS

Over 60,000 parts in stock

Legacy + Obsolescence upgrades

OBSOLESCENCE MITIGATION

Legacy + Obsolescence upgrades

RS170 upgrades for all CD-SEMs

Size conversions +
chamber additions

Defect Review

Applied Materials®, Inc. has introduced the SEMVision DR-SEM system, a fully-automated defect review and classification scanning electron microscope specifically designed for in-line operation on advanced semiconductor production lines. The system uses several SEM imaging and material analysis techniques to improve chipmakers’ yield learning cycles during fab ramp-up and enables tighter yield control in volume production.

Critical Dimension

The Applied Materials®, Inc. VeraSEM family of system’s exceptional in-line accuracy and process control eliminate more time-consuming and costly off-line wafer cross-sectioning while helping chipmakers to streamline process development, improve device performance and yield, and shorten ramp times to high-volume production.

Watch: one of our tools running Final ADC test at GTi's lab.

Contact Directly

Headquarters

15936 N 78th St
Scottsdale, AZ 85260

Toll Free: (800) 608-4834
Local: (480) 400-6910

Sales

Asia

GTI Technology Limited

Unit E. 11/F Tower B Billion Center No. 1 Wang Kwong Road Kowloon Bay

Hong Kong

+86-13817852188

+14802955535

Europe North

TELTEC
Am Moosbach 6
74535 Mainhardt

Phone: +49 790 391 4412

Mobile: +49 173 279 1153

Fax: +49 790 391 4411

Europe South

Malta I Morocco

Teltec SAS
939, rue de la croix verte
34090 Montpellier

Phone: +33 467 22 40 00

Fax: +33 467 22 26 37